Statistical Models and Control Charts for High-Quality Processes by Min Xie (Eng

Description: Statistical Models and Control Charts for High-Quality Processes by Min Xie, Thong Ngee Goh, Vellaisamy Kuralmani Presents techniques of using control charts for high-quality processes, some findings and applications of statistical control chart techniques for ZD processes are also presented. This work discusses a technique based on counting of the cumulative conforming (CCC) items between two nonconforming ones. FORMAT Hardcover LANGUAGE English CONDITION Brand New Publisher Description Control charts are widely used in industry to monitor processes that are far from Zero-Defect (ZD) and their use in a near Zero-Defect manufacturing environment poses many problems. This book presents techniques of using control charts for high-quality processes. Recent findings and applications of statistical control chart techniques for ZD processes are also discussed. A powerful technique based on counting of the cumulative conforming (CCC) items between two nonconforming ones is examined in detail. Extensions of the CCC chart are described, as well as applications of cumulative sum and exponentially weighted moving average techniques to CCC-related data, multivariate methods, economic design of control chart procedures and modelling and analysis of trended but regularly adjusted processes. Many examples, charts and procedures are presented throughout the book and references are provided for those interested in exploring the details. A number of questions and issues are posed for further investigations.Researches and students may find many ideas in this book useful in their academic work, as a foundation is laid for the exploration of many further theoretical and practical issues. Author Biography D. N. PRABHAKAR MURTHY, PhD, is a Professor of Engineering and Operations Management at the University of Queensland in Brisbane, Australia. He received his PhD in applied mathematics from Harvard University. MIN XIE, PhD, is an Associate Professor of Industrial and Systems Engineering at the National University of Singapore in Kent Ridge Crescent, Singapore. He received his PhD in quality technology from Linkoping University in Linkoping, Sweden. RENYAN JIANG, PhD, is a Professor of Engineering at the Changsha University of Science and Technology and is also affiliated with the Depart Table of Contents Control Charts with Probability Limits.- Cumulative Count of Conforming (CCC) Chart.- Process Improvement Detection.- Modified Implementation of Geometric Chart.- Some Extensions to the Geometric Model.- CUSUM and EWMA Procedures.- Monitoring of Multiple Process Characteristics.- Economic Design of Geometric Chart.- Monitoring and Adjustment of Trended Processes. Promotional Springer Book Archives Long Description Control charts are widely used in industry to monitor processes that are far from Zero-Defect (ZD), and their use in a near Zero-Defect manufacturing environment poses many problems. This book presents techniques of using control charts for high-quality processes, and some recent findings and applications of statistical control chart techniques for ZD processes are presented. A powerful technique based on counting of the cumulative conforming (CCC) items between two nonconforming ones is discussed in detail. Extensions of the CCC chart are described, as well as applications of cumulative sum and exponentially weighted moving average techniques to CCC-related data, multivariate methods, economic design of control chart procedures, and modeling and analysis of trended but regularly adjusted processes. Many examples, charts, and procedures, are presented throughout the book, and references are provided for those interested in exploring the details. A number of questions and issues are posed for further investigations. Researchers and students may find many ideas in this book useful in their academic work, as a foundation is laid for the exploration of many further theoretical and practical issues. Details ISBN1402070748 Author Vellaisamy Kuralmani Short Title STATISTICAL MODELS & CONTROL C Language English ISBN-10 1402070748 ISBN-13 9781402070747 Media Book Format Hardcover Year 2002 Publication Date 2002-06-30 Edition 1st Country of Publication United States Affiliation National Univ. of Singapore Edition Description 2002 Pages 276 Imprint Springer-Verlag New York Inc. Place of Publication New York, NY DOI 10.1007/b109654;10.1007/978-1-4615-1015-4 AU Release Date 2002-06-30 NZ Release Date 2002-06-30 US Release Date 2002-06-30 UK Release Date 2002-06-30 Publisher Springer-Verlag New York Inc. Alternative 9781461353522 DEWEY 620.0045 Illustrations XV, 276 p. Audience Undergraduate We've got this At The Nile, if you're looking for it, we've got it. With fast shipping, low prices, friendly service and well over a million items - you're bound to find what you want, at a price you'll love! TheNile_Item_ID:96264469;

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