Description: Multi-Chip Module Test Strategies, Paperback by Zorian, Yervant (EDT), ISBN 079239920X, ISBN-13 9780792399209, Like New Used, Free shipping in the US MCMs today consist of dense VLSI devices mounted into packages that allow little physical access to internal modes, and the complexity and cost associated with their test and diagnosis are major obstacles to their use. Addressing the interests of engineers and designers, 14 contributions cover the necessary background on MCMs and MCM testing, the three major levels of manufacturing tests and their corresponding design-for-testability techniques, the key issues of diagnosing at the assembly level, various simulation techniques, and trade-offs related to diverse test solutions and their economic impact on MCM fabrication. Annotation c. by Book News, Inc., Portland, Or.
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Book Title: Multi-Chip Module Test Strategies
Number of Pages: 167 Pages
Publication Name: Multi-Chip Module Test Strategies
Language: English
Publisher: Springer
Item Height: 0.3 in
Publication Year: 1997
Subject: Electronics / Microelectronics, Electronics / Circuits / General, Electrical
Type: Textbook
Item Weight: 20.3 Oz
Subject Area: Technology & Engineering
Item Length: 10 in
Author: Yervant Zorian
Item Width: 8 in
Series: Frontiers in Electronic Testing Ser.
Format: Hardcover
