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Measuring Success: Testing, Grades, and the Future of College Admissions by Jack

Description: Measuring Success by Jack Buckley, Lynn Letukas, Ben Wildavsky Estimated delivery 3-12 business days Format Hardcover Condition Brand New Description Shaw, Kyle Sweitzer, Roger J. Thompson, Meredith Welch, Rebecca Zwick Publisher Description Standardized tests have become the gateway to higher education . . . but should they be?For more than seventy-five years, standardized tests have been considered a vital tool for gauging students readiness for college. However, few people—including students, parents, teachers, and policy makers—understand how tests like the SAT or ACT are used in admissions decisions. Once touted as the best way to compare students from diverse backgrounds, these tests are now increasingly criticized as being biased in favor of traditionally privileged groups. A small but growing number of colleges have made such testing optional for applicants.Is this the right way to go? Measuring Success investigates the research and policy implications of test-optional practices, considering both sides of the debate. Does a test-optional policy result in a more diverse student body or improve attainment and retention rates? Drawing upon the expertise of higher education researchers, admissions officers, enrollment managers, and policy professionals, this volume is among the first to investigate the research and policy implications of test-optional practices. Although the test-optional movement has received ample attention, its claims have rarely been subjected to empirical scrutiny. This volume provides a much-needed evaluation of the use and value of standardized admissions tests in an era of widespread grade inflation. It will be of great value to those seeking to strike the proper balance between uniformity and fairness in higher education. Contributors: Andrew S. Belasco, A. Emiko Blalock, William G. Bowen, Jim Brooks, Matthew M. Chingos, James C. Hearn, Michael Hurwitz, Jonathan Jacobs, Nathan R. Kuncel, Jason Lee, Jerome A. Lucido, Eric Maguire, Krista Mattern, Michael S. McPherson, Kelly O. Rosinger, Paul R. Sackett, Edgar Sanchez, Dhruv B. Sharma, Emily J. Shaw, Kyle Sweitzer, Roger J. Thompson, Meredith Welch, Rebecca Zwick Author Biography Jack Buckley is the senior vice president of research and evaluation at the American Institutes for Research and a research associate professor of applied statistics at New York University. He is the coauthor of Charter Schools: Hope or Hype? Lynn Letukas is an associate research scientist at the College Board. She is the author of Primetime Pundits: How Cable News Covers Social Issues. Ben Wildavsky is senior fellow and executive director at the College Board Policy Center. He is the author of The Great Brain Race: How Global Universities are Reshaping the World. Details ISBN 1421424967 ISBN-13 9781421424965 Title Measuring Success Author Jack Buckley, Lynn Letukas, Ben Wildavsky Format Hardcover Year 2018 Pages 344 Publisher Johns Hopkins University Press GE_Item_ID:136549919; About Us Grand Eagle Retail is the ideal place for all your shopping needs! With fast shipping, low prices, friendly service and over 1,000,000 in stock items - you're bound to find what you want, at a price you'll love! Shipping & Delivery Times Shipping is FREE to any address in USA. Please view eBay estimated delivery times at the top of the listing. Deliveries are made by either USPS or Courier. We are unable to deliver faster than stated. International deliveries will take 1-6 weeks. NOTE: We are unable to offer combined shipping for multiple items purchased. This is because our items are shipped from different locations. Returns If you wish to return an item, please consult our Returns Policy as below: Please contact Customer Services and request "Return Authorisation" before you send your item back to us. Unauthorised returns will not be accepted. Returns must be postmarked within 4 business days of authorisation and must be in resellable condition. Returns are shipped at the customer's risk. We cannot take responsibility for items which are lost or damaged in transit. For purchases where a shipping charge was paid, there will be no refund of the original shipping charge. Additional Questions If you have any questions please feel free to Contact Us. Categories Baby Books Electronics Fashion Games Health & Beauty Home, Garden & Pets Movies Music Sports & Outdoors Toys

Price: 63.81 USD

Location: Fairfield, Ohio

End Time: 2024-11-19T03:51:11.000Z

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Measuring Success: Testing, Grades, and the Future of College Admissions by Jack

Item Specifics

Restocking Fee: No

Return shipping will be paid by: Buyer

All returns accepted: Returns Accepted

Item must be returned within: 30 Days

Refund will be given as: Money Back

ISBN-13: 9781421424965

Book Title: Measuring Success

Number of Pages: 344 Pages

Publication Name: Measuring Success : Testing, Grades, and the Future of College Admissions

Language: English

Publisher: Johns Hopkins University Press

Item Height: 1 in

Subject: College Entrance, Higher, Testing & Measurement

Publication Year: 2018

Item Weight: 20.8 Oz

Type: Textbook

Author: Lynn Letukas

Subject Area: Education, Study Aids

Item Length: 9.2 in

Item Width: 6.2 in

Format: Hardcover

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