Description: Book DetailsTitle: Journey to Data Quality (The MIT Press) Item Condition:used item in a very good conditionAuthor: Yang W. Lee, Leo L. Pipino, Richard Y. Wang, James D. Funk ISBN 10:0262513358Publisher:The MIT Press ISBN 13:9780262513357Published On:21 Aug 2009 SKU:7719-9780262513357Binding:Paperback Language: englishEdition:Reprint List Price:- At AwesomeBooks we believe that good quality and speed of service is what pleases our customers and according to this we have a product guarantee on all our books. All used books sold by AwesomeBooks:Will be clean, not soiled or stained.All pages will be present and undamaged.Books will be free of page markings.Some pages may be slightly dog-eared through previous use.The spine may show some creasing through previous use.Ultimately we would never send any book we would not pick up and read ourselves. All new books sold by AwesomeBooks:Will be completely new and unfolded.Wrapped carefully to prevent damage or curling of book edges.100% money back guarantee If you are not satisfied for any reason, simply drop us an email and we will give you a 100% refund upon returning the item. If you are not happy then neither are we. If your order has not be reached you within a maximum of 21 days please contact us and we will respond immediately to help. Return Policy At AwesomeBooks, we believe our customers should feel free to order any of our products in the knowledge that they can return anything back within 30 days of purchasing an item for any reason. We will not make it awkward, if you want to return something then all you have to do is ask! Simply drop us an email to the address given on your order confirmation email or login to your paypal account used for payment and send us an email from there. For defects or problems caused before receipt of an item we will of course provide full instructions on how to return the item to us. For other issues (perhaps you did not like a product or it did not live up to expectations), we are happy to refund all costs but require the buyer to pay the return postage cost. Once you drop us an email requesting a return, we will let you know the precise return method quickly and conveniently.
Price: 13.78 USD
Location: NY
End Time: 2024-09-13T08:50:27.000Z
Shipping Cost: 0 USD
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Restocking Fee: No
Return shipping will be paid by: Buyer
All returns accepted: Returns Accepted
Item must be returned within: 30 Days
Refund will be given as: Money Back
Title: Journey to Data Quality (The MIT Press)
Item Length: 8.9in.
Item Height: 0.5in.
Item Width: 6.3in.
Author: Yang w. Lee, Leo L. Pipino, Y. Lee, James D. FUNK international GmbH, Richard Y. Wang
Publication Name: JOURNEY to Data Quality
Format: Trade Paperback
Language: English
Publisher: The MIT Press
Publication Year: 2009
Type: Textbook
Item Weight: 11 Oz
Number of Pages: 240 Pages
