Description: Journey to Data Quality (MIT Press) - Paperback By Lee, Yang W - GOOD Product Id:0262513358 Condition:USED_GOOD Notes:Item in good condition and has highlighting/writing on text. Used texts may not contain supplemental items such as CDs, info-trac etc...
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Location: Montgomery, Illinois
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Item must be returned within: 30 Days
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Brand: Unbranded
Book Title: Journey to Data Quality (MIT Press)
MPN: Does not apply
Item Length: 8.9in.
Item Height: 0.5in.
Item Width: 6.3in.
Author: Yang w. Lee, Leo L. Pipino, Y. Lee, James D. FUNK international GmbH, Richard Y. Wang
Publication Name: JOURNEY to Data Quality
Format: Trade Paperback
Language: English
Publisher: The MIT Press
Publication Year: 2009
Type: Textbook
Item Weight: 11 Oz
Number of Pages: 240 Pages
