Journey to Data Quality by Yang W Lee: Used

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Price: 9.33 USD

Location: Sparks, Nevada

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Book Title: Journey to Data Quality

Publication Date: 2009-09-01

Pages: 226

Number of Pages: 240 Pages

Publication Name: Journey to Data Quality

Language: English

Publisher: MIT Press

Item Height: 0.5 in

Subject: Data Modeling & Design, Industrial Management, Databases / General, Enterprise Applications / General, Information Technology

Publication Year: 2009

Item Weight: 11 Oz

Type: Textbook

Subject Area: Computers, Business & Economics

Author: James D. Funk, Leo L. Pipino, Y. Lee, Yang W. Lee, Richard Y. Wang

Item Length: 8.9 in

Item Width: 6.3 in

Format: Trade Paperback