Description: Applied Scanning Probe Methods IV Please note: this item is printed on demand and will take extra time before it can be dispatched to you (up to 20 working days). Industrial Applications Author(s): Bharat Bhushan, Harald Fuchs Format: Paperback Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, Germany Imprint: Springer-Verlag Berlin and Heidelberg GmbH & Co. K ISBN-13: 9783642065972, 978-3642065972 Synopsis The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rstthere were two -the ScanningTunnelingMicroscope,or STM,andtheAtomicForceMic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when [url] were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, [url] [url] atSantaBarbaraopenedthedoorevenwiderwhenhewasabletoimagebiological objects in aqueous environments. At this point the sluice gates were opened and amultitudeofdifferentinstrumentsappeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM canrecord3Dimage andmovies, featuresthatarenotavailable withthescanning probes. [url] thistimetheinstrumentsuffersfromtwolimitations;1)mostoftheopticalenergy is lost as it traverses the cut-off region of the tapered ?ber and 2) the resolution is insuf?cient for many purposes. We are con?dent that NSOM's with a reasonable [url] enterthemainstreamofscanningprobes. VI Foreword In the Harmonic Force Microscope or HFM, the cantilever is driven at the resonantfrequencywiththeamplitudeadjustedsothatthetipimpactsthesampleon each cycle. Theforcesbetween tipandsample generate multiple harmonics inthe [url] thephysicalpropertiesofthesurface.
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Book Title: Applied Scanning Probe Methods IV
Number of Pages: 284 Pages
Publication Name: Applied Scanning Probe Methods Iv: Industrial Applications
Language: English
Publisher: Springer-Verlag Berlin AND Heidelberg Gmbh & Co. KG
Item Height: 235 mm
Subject: Engineering & Technology, Chemistry, Science, Physics
Publication Year: 2010
Type: Textbook
Item Weight: 504 g
Subject Area: Mechanical Engineering, Nanotechnology
Author: Bharat Bhushan, Harald Fuchs
Item Width: 155 mm
Series: Nanoscience and Technology
Format: Paperback
